semiconductor test

Teradyne’s test platforms, the UltraFLEX and J750, provide the power and precision needed as well as the test speed and coverage to optimally serve the broad range of testing needs for the Digital/Mixed Signal Market. From digital devices, which include the most complex and high-value semiconductors, to mixed-signal SoC devices at the core of mobile devices and game consoles—Teradyne is the tester of choice for the Digital/Mixed Signal market.

• UltraFLEX
  
• J750

Analog and power electronics require test solutions that are flexible and powerful enough to cover the range of power management systems they control—from mobile devices to electric vehicles. Teradyne’s Eagle, J750 and FLEX platforms deliver high-performance and cost-efficient test solutions for this market.

• ETS-800
• ETS-88
• ETS-200T/ETS-200T-FT
• ETS-364/ETS-600
• FLEX
• microFLEX

With the expanding Internet of Things (IoT) market, microcontrollers have become an even higher-volume component of the semiconductor market. Image sensors are being used in an increasingly wide variety of applications, including digital cameras, cars and mobile and wearable devices. Teradyne has two platforms to cost-effectively meet your test needs. 

• J750
• IP750

Memory is divided into two main camps: DRAM and Flash. DRAM is used in computing devices and graphics adaptors, while Flash is used as a storage media in mobile devices and solid-state drive devices. Teradyne provides complete coverage for testing of all memory devices with the highest parallelism and lowest cost of test.

Magnum - ideal for testing low-speed DRAM and flash memory

• Magnum
• Magnum 2
• Magnum 2x
• Magnum V

UltraFLEX-M - designed for testing high-speed DRAM devices

Mobile access is becoming an increasing expectation as a part of everyday life, and Teradyne is the leader in RF test for both cellular and wi-fi capabilities.

• UltraFLEX
• J750-LitePoint